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发表于 2019-7-27 13:15:00
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[ol]Device Model: M16CSD1-200UCV-DSerial Number: STM0001848E5LU WWN Device Id: 5 000a72 03008abb1Add. Product Id: DELL(tm)Firmware Version: 00000379User Capacity: 200,049,647,616 bytes [200 GB]Sector Size: 512 bytes logical/physicalRotation Rate: Solid State DeviceForm Factor: 2.5 inchesDevice is: Not in smartctl database [for details use: -P showall]ATA Version is: ATA8-ACS T13/1699-D revision 4Local Time is: Sat Jul 27 13:09:02 2019 CSTSMART support is: Available - device has SMART capability.SMART support is: Enabled=== START OF READ SMART DATA SECTION ===SMART overall-health self-assessment test result: PASSEDGeneral SMART Values:Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled.Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run.Total time to complete Offline data collection: ( 0) seconds.Offline data collectioncapabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported.SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer.Error logging capability: (0x01) Error logging supported. General Purpose Logging supported.Short self-test routine recommended polling time: ( 2) minutes.Extended self-test routinerecommended polling time: ( 3) minutes.Conveyance self-test routinerecommended polling time: ( 3) minutes.SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported.SMART Attributes Data Structure revision number: 2560Vendor Specific SMART Attributes with Thresholds:ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002e 100 100 025 Old_age Always - 0 2 Throughput_Performance 0x0027 100 100 025 Pre-fail Always - 250 5 Reallocated_Sector_Ct 0x002f 100 100 010 Pre-fail Always - 1 9 Power_On_Hours 0x0032 082 082 000 Old_age Always - 11354 12 Power_Cycle_Count 0x0032 100 100 010 Old_age Always - 28 13 Read_Soft_Error_Rate 0x002e 100 100 000 Old_age Always - 0100 Unknown_Attribute 0x0032 095 095 000 Old_age Always - 2359103 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0177 Wear_Leveling_Count 0x0032 095 095 000 Old_age Always - 19391015179 Used_Rsvd_Blk_Cnt_Tot 0x0033 100 100 010 Pre-fail Always - 1180 Unused_Rsvd_Blk_Cnt_Tot 0x0032 099 099 010 Old_age Always - 30438181 Program_Fail_Cnt_Total 0x0032 100 100 000 Old_age Always - 0182 Erase_Fail_Count_Total 0x0032 100 100 000 Old_age Always - 0187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0188 Command_Timeout 0x0032 100 100 000 Old_age Always - 2194 Temperature_Celsius 0x0002 040 060 000 Old_age Always - 20 (0 0 0 60 40)195 Hardware_ECC_Recovered 0x0032 100 100 000 Old_age Always - 0198 Offline_Uncorrectable 0x0032 100 100 000 Old_age Always - 0199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 1201 Unknown_SSD_Attribute 0x0033 100 100 000 Pre-fail Always - 0233 Media_Wearout_Indicator 0x0032 100 100 000 Old_age Always - 391150588240 Unknown_SSD_Attribute 0x0032 100 100 000 Old_age Always - 1245 Unknown_Attribute 0x0032 093 093 000 Old_age Always - 2943SMART Error Log Version: 1No Errors LoggedSMART Self-test log structure revision number 256Warning: ATA Specification requires self-test log structure revision number = 1Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error# 1 Extended offline Completed without error 00% 35863 -# 2 Short offline Completed without error 00% 11014 -# 3 Short offline Completed without error 00% 256 -SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testingSelective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk.If Selective self-test is pending on power-up, resume after 0 minute delay.[/ol]复制代码 |
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